mirror of
https://github.com/encounter/SDL.git
synced 2025-12-19 09:55:29 +00:00
test: Add a unit test for input device classification heuristics
This uses pre-recorded evdev capabilities, so that we can check for regressions without the devices having to be physically present. Signed-off-by: Simon McVittie <smcv@collabora.com>
This commit is contained in:
1031
test/testevdev.c
Normal file
1031
test/testevdev.c
Normal file
File diff suppressed because it is too large
Load Diff
Reference in New Issue
Block a user