tint: remove redundant insertBits tests
Meant to remove this in https://dawn-review.googlesource.com/c/dawn/+/110482 Bug: tint:1581 Bug: chromium:53440 Change-Id: I38a51873b93c2bfbf6ea20456a7992422ead6208 Reviewed-on: https://dawn-review.googlesource.com/c/dawn/+/110446 Commit-Queue: Ben Clayton <bclayton@google.com> Auto-Submit: Antonio Maiorano <amaiorano@google.com> Reviewed-by: Ben Clayton <bclayton@google.com> Kokoro: Kokoro <noreply+kokoro@google.com>
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@ -1179,33 +1179,6 @@ INSTANTIATE_TEST_SUITE_P( //
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testing::ValuesIn(Concat(InsertBitsCases<i32>(), //
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InsertBitsCases<u32>()))));
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using ResolverConstEvalBuiltinTest_InsertBits_InvalidOffsetAndCount =
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ResolverTestWithParam<std::tuple<size_t, size_t>>;
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TEST_P(ResolverConstEvalBuiltinTest_InsertBits_InvalidOffsetAndCount, Test) {
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auto& p = GetParam();
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auto* expr = Call(Source{{12, 34}}, sem::str(sem::BuiltinType::kInsertBits), Expr(1_u),
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Expr(1_u), Expr(u32(std::get<0>(p))), Expr(u32(std::get<1>(p))));
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GlobalConst("C", expr);
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EXPECT_FALSE(r()->Resolve());
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EXPECT_EQ(r()->error(),
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"12:34 error: 'offset + 'count' must be less than or equal to the bit width of 'e'");
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}
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INSTANTIATE_TEST_SUITE_P(InsertBits,
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ResolverConstEvalBuiltinTest_InsertBits_InvalidOffsetAndCount,
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testing::Values( //
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std::make_tuple(33, 0), //
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std::make_tuple(34, 0), //
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std::make_tuple(1000, 0), //
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std::make_tuple(u32::Highest(), 0), //
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std::make_tuple(0, 33), //
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std::make_tuple(0, 34), //
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std::make_tuple(0, 1000), //
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std::make_tuple(0, u32::Highest()), //
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std::make_tuple(33, 33), //
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std::make_tuple(34, 34), //
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std::make_tuple(1000, 1000), //
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std::make_tuple(u32::Highest(), u32::Highest())));
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template <typename T>
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std::vector<Case> ExtractBitsCases() {
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using UT = Number<std::make_unsigned_t<UnwrapNumber<T>>>;
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